ITFSI has a wide range of resources for producing high quality research outputs. These give the institute capabilities in characterisation, modelling, sensors & imaging. The institute has a wide range of deposition and metrology equipment, from high-throughput sputtering systems to scanning electron microscopy. New clean room facilities are currently being upgraded for higher quality thin film investigations.
Thin Film Deposition Systems
CVC AST304 RF Magnetron Sputtering system has two targets available and is equipped with a cryopump for reaching high-vacuum.
Microwave-plasma assisted pulsed-DC sputtering system is capable of producing high quality optical thin films. For more information, click here.
PECVD system for producing high quality diamond like carbon (DLC) coatings. This system at ITFSI is equipped with a hollow cathode.
Satis 370 is a custom electron-beam deposition system, recently updated to do co-deposition and is equipped with a ITFSI designed plasma source for plasma-enhanced electron beam deposition.
Molecular beam epitaxy system (located at Gas Sensing Solutions Ltd. West of Scotland Science Park, Glasgow). Shared facility with Gas Sensing Solutions Ltd, Glasgow, Strathclyde, Stanford USA and West of Scotland universities.
PlasmaCoat RF Sputtering system is a small-batch, high-throughput deposition system. At ITFSI, there are two PlasmaCoat sputtering systems. For more information, please click here.
Analytical Techniques at ITFSI
Aquila nkd 8000 optical spectrometer can simultaneously measure the transmission and reflection data within the visible/near-IR range.
Thermo Fisher Scientific Nicolet iS50 FTIR has accessories for measuring the IR transmission and reflection. Chamber can be flushed out with nitrogen to remove effects from carbon dioxide.
Siemens D5000 X-Ray Diffractometer is equipped with a copper x-ray source and can take a range of different measurement settings. Particularly used in the identification of crystal phases in samples.
Thermo Fisher Scientific DXR Raman microscope is capable of measuring Raman scattering as well as enabled for SERS applications. For more information, click here.
Hitachi S4100 electron microscope equipped with a new Oxford Instruments EDS detector. For more information, please click here.
ITFSI has ellipsometry capabilities for sample optical analysis.